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Journal of Synthetic Crystals, Volume. 53, Issue 2, 238(2024)

Characterization Method for Internal Defects in Laser Crystals Based on Slice Beam Scanning

QIAN Mengxue1,2, ZHANG Zhirong1,2,3、*, WANG Huadong2, ZHANG Qingli2,4, and SUN Yu3
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  • 1[in Chinese]
  • 2[in Chinese]
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    QIAN Mengxue, ZHANG Zhirong, WANG Huadong, ZHANG Qingli, SUN Yu. Characterization Method for Internal Defects in Laser Crystals Based on Slice Beam Scanning[J]. Journal of Synthetic Crystals, 2024, 53(2): 238

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    Paper Information

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    Received: Oct. 19, 2023

    Accepted: --

    Published Online: Jul. 30, 2024

    The Author Email: Zhirong ZHANG (zhangzr@aiofm.ac.cn)

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology