Acta Optica Sinica, Volume. 20, Issue 10, 1378(2000)

The Principle of the Scatter Plate Interferometry Based on Statistical Optics

[in Chinese]
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    References(6)

    [1] [1] Malacara D. Optical Shop Testing. New York: John Wiley & Sons. 1978. 71~73

    [3] [3] Burch J M. Scatter fringes of equal thickness. Nature, 1953, 171:889~890

    [4] [4] Burch J M. Scatter-fringe interferometry. J. Opt. Soc. Am., 1962, 52():600~

    [6] [6] Scott R M. Scatter plate interferometry. Appl. Opt., 1969, 8():531~533

    [8] [8] Goodman J W. Introduction to Fourier Optics. New York: McGraw-Hill, 1968.

    [9] [9] Goodman J W. Statistical Optics. New York: John Wiley & Sons., 1985. 347~356

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    [in Chinese]. The Principle of the Scatter Plate Interferometry Based on Statistical Optics[J]. Acta Optica Sinica, 2000, 20(10): 1378

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Apr. 2, 1999

    Accepted: --

    Published Online: Aug. 9, 2006

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