Opto-Electronic Engineering, Volume. 48, Issue 6, 210071(2021)
Measurement of absorption loss of optical thin-film by infrared thermal imaging
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Jing Jianhang, Kong Mingdong, Wang Qiang, Guo Chun. Measurement of absorption loss of optical thin-film by infrared thermal imaging[J]. Opto-Electronic Engineering, 2021, 48(6): 210071
Category: Article
Received: Mar. 15, 2021
Accepted: --
Published Online: Sep. 4, 2021
The Author Email: Mingdong Kong (kongmingdong@126.com)