High-sensitivity modulation of electromagnetically induced transparency analog in a THz asymmetric metasurface integrating perovskite and graphene

Tongling Wang; Tengteng Li; Haiyun Yao; Yuying Lu; Xin Yan; Maoyong Cao; Lanju Liang; Maosheng Yang; Jianquan Yao

doi:10.1364/PRJ.461787

Photonics Research, Volume. 10, Issue 10, 2317(2022)

High-sensitivity modulation of electromagnetically induced transparency analog in a THz asymmetric metasurface integrating perovskite and graphene

Tongling Wang^1、†, Tengteng Li^2、†, Haiyun Yao³, Yuying Lu⁴, Xin Yan³, Maoyong Cao^1,6、*, Lanju Liang^3,7、*, Maosheng Yang^5,8、*, and Jianquan Yao²

Author Affiliations

¹School of Information and Automation Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan 250353, China

²State Key Laboratory of Dynamic Measurement Technology, North University of China, Taiyuan 030051, China

³School of Opto-electronic Engineering, Zaozhuang University, Zaozhuang 277160, China

⁴Precision Optical Manufacturing and Testing Centre, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

⁵School of Electrical and Optoelectronic Engineering, West Anhui University, Lu’an 237000, China

⁶e-mail: cmy@qlu.edu.cn

⁷e-mail: lianglanju123@163.com

⁸e-mail: 42000027@wxc.edu.cn

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Tongling Wang, Tengteng Li, Haiyun Yao, Yuying Lu, Xin Yan, Maoyong Cao, Lanju Liang, Maosheng Yang, Jianquan Yao, "High-sensitivity modulation of electromagnetically induced transparency analog in a THz asymmetric metasurface integrating perovskite and graphene," Photonics Res. 10, 2317 (2022)

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Paper Information

Category: Surface Optics and Plasmonics

Received: Apr. 21, 2022

Accepted: Aug. 15, 2022

Published Online: Sep. 27, 2022

The Author Email: Maoyong Cao (cmy@qlu.edu.cn), Lanju Liang (lianglanju123@163.com), Maosheng Yang (42000027@wxc.edu.cn)

DOI:10.1364/PRJ.461787

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology