Fig. 1. Schematic of reflection and transmission of single layer dielectric film

Fig. 2. BTO film sample and test results of refractive index. (a) Physical drawing of sample; (b) test results of refractive index of BTO film

Fig. 3. Comparative analysis of reflection spectra of dispersive refractive index and constant refractive index

Fig. 4. Calculation and measured reflection spectra of fabriacated sample

Fig. 5. Reflection spectra at different incident angles of flat film structure. (a) Reflection spectra of TE waves; (b) reflection spectra of TM waves

Fig. 6. Distributions of out-of-plane electric field component E_z in film for TE wave. (a) E_z distribution of 364 nm light wave at 0° incidence; (b) E_z distribution of 440 nm light wave at 85° incidence

Fig. 7. Distributions of out-of-plane magnetic field component H_z in film for TM wave. (a) H_z distribution of 364 nm light wave at 0° incidence; (b) H_z distribution of 440 nm light wave at 85° incidence

Fig. 8. Reflection spectra of equivalent natural light of flat film structure at different incident angles

Fig. 9. Schematic diagram of angle dependence. (a) High angle dependence of flat film structure; (b) low angle dependence of random perturbation surface structure

Fig. 10. Generated random perturbation surfaces for different β. (a) β=0.7; (b) β=1.4; (c) β=2.1; (d) β=2.8

Fig. 11. Schematic diagram of simulation model of random perturbation surface reflection spectrum

Fig. 12. Reflection spectra of TE wave at normal incidence. (a) H₁=10 nm; (b) H₁=40 nm; (c) H₁=80 nm; (d) H₁=120 nm

Fig. 13. TM wave reflection spectra at normal incidence. (a) H₁=10 nm; (b) H₁=40 nm; (c) H₁=80 nm; (d) H₁=120 nm

Fig. 14. Reflection spectra of random perturbation surface structure at different incident angles. (a) Reflection spectra of TE waves; (b) reflection spectra of TM waves

Fig. 15. Reflection spectra of equivalent natural light of random perturbation surface structure at different incident angles