Infrared and Laser Engineering, Volume. 50, Issue 12, 20210624(2021)

Study on measurement method of mirror reflection laser tracking interferometric length measurement

Shaodong Ping1, Yunxia Fu2,3, Feng Zhang2,3, Yu Ren2,3, and Ming Kong1
Author Affiliations
  • 1Collage of Metrology & Measurement Engineering, China Jiliang University, Hangzhou 310018, China
  • 2Shanghai Institute of Measurement and Testing Technology, Shanghai 201203, China
  • 3Shanghai Key Laboratory of On-line Testing and Control Technology, Shanghai 201203, China
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    Figures & Tables(11)
    Model of laser tracking interferometric length measurement
    Principle of mirror reflection laser tracking interferometric length measurement
    Plane mirror deviation
    Correspondence between and 与的对应关系
    Flatness error
    Variation trend of with 随的变化规律
    Variation of with different length随不同长度的变化规律
    Length standard measurement experiment
    Length deviation and uncertainty of measurement
    • Table 1. En verification result

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      Table 1. En verification result

      Interferometric length measurementCoordinate measuring machine
      $ L/{\text{mm}} $$ U/{\text{μm}} $$ {L_{ { { {P} }_{\text{1} } }{ { {P} }_{\text{2} } } } }/{\text{mm} } $$ {U_0}/{\text{μm}} $En
      1000.28331.11000.28252.60.3
    • Table 2. Angle adjustment verification result

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      Table 2. Angle adjustment verification result

      $ L/{\text{mm}} $Adjustment strategyAngle $ \;\beta /({^ \circ } )$$ \overline M $/times $ \overline t /\min $$ \Delta L/{\text{μm}} $$ U/{\text{μm}} $
      1000 Rough adjustment0.0421149.211.7
      This paper strategy0.00969101.23.0
      Optimal state0.000318231.1
      Rough adjustment0.2746157.68.1
      2500This paper strategy0.029310132.63.7
      Optimal state0.000521283.1
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    Shaodong Ping, Yunxia Fu, Feng Zhang, Yu Ren, Ming Kong. Study on measurement method of mirror reflection laser tracking interferometric length measurement[J]. Infrared and Laser Engineering, 2021, 50(12): 20210624

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    Paper Information

    Category: Photoelectric measurement

    Received: Aug. 30, 2021

    Accepted: --

    Published Online: Feb. 9, 2022

    The Author Email:

    DOI:10.3788/IRLA20210624

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