Chinese Journal of Lasers, Volume. 42, Issue 11, 1108002(2015)
Micro In-Plane Displacement Measurement Using New Speckle Phase Singularities Method Generated by Two-Dimensional Directional Wavelet
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Gao Yuling, Pan Guangzhen. Micro In-Plane Displacement Measurement Using New Speckle Phase Singularities Method Generated by Two-Dimensional Directional Wavelet[J]. Chinese Journal of Lasers, 2015, 42(11): 1108002
Paper Information
Category: Measurement and metrology
Received: May. 22, 2015
Accepted: --
Published Online: Sep. 24, 2022
The Author Email: Yuling Gao (839460408@qq.com)
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