Chinese Optics Letters, Volume. 23, Issue 7, 072701(2025)

Entanglement-assisted polarimeter for phase retardance measurement

Mengyu Xie1,2, Sujian Niu1,2,3, Zheng Ge1,2, Mingyuan Gao1,2, Zhaoqizhi Han1,2, Renhui Chen1,2, Yinhai Li1,2、*, Zhiyuan Zhou1,2、**, and Baosen Shi1,2
Author Affiliations
  • 1Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, China
  • 2Synergetic Innovation Center of Quantum Information & Quantum Physics, University of Science and Technology of China, Hefei 230026, China
  • 3Xinjiang Key Laboratory for Luminescence Minerals and Optical Functional Materials, School of Physics and Electronic Engineering, Xinjiang Normal University, Urumqi 830054, China
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    References(24)

    [3] H. Fujiwara. Spectroscopic Ellipsometry: Principles and Applications(2007).

    [19] F. D. Bloss. The Spindle Stage: Principles and Practice(1981).

    [20] M. A. Nielsen, I. L. Chuang. Quantum Computation and Quantum Information: 10th Anniversary Edition(2011).

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    Mengyu Xie, Sujian Niu, Zheng Ge, Mingyuan Gao, Zhaoqizhi Han, Renhui Chen, Yinhai Li, Zhiyuan Zhou, Baosen Shi, "Entanglement-assisted polarimeter for phase retardance measurement," Chin. Opt. Lett. 23, 072701 (2025)

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    Paper Information

    Category: Quantum Optics and Quantum Information

    Received: Jan. 9, 2025

    Accepted: Mar. 7, 2025

    Published Online: Jun. 17, 2025

    The Author Email: Yinhai Li (lyhly@ustc.edu.cn), Zhiyuan Zhou (zyzhouphy@ustc.edu.cn)

    DOI:10.3788/COL202523.072701

    CSTR:32184.14.COL202523.072701

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