Extreme Ultraviolet, X-Ray and Neutron Thin Film Optical Components and Systems

Zhanshan Wang; Qiushi Huang; Zhong Zhang; Shengzhen Yi; Wenbin Li; Zhengxiang Shen; Runze Qi; Jun Yu

doi:10.3788/AOS202141.0131001

Acta Optica Sinica, Volume. 41, Issue 1, 0131001(2021)

Extreme Ultraviolet, X-Ray and Neutron Thin Film Optical Components and Systems

Zhanshan Wang^*, Qiushi Huang, Zhong Zhang, Shengzhen Yi, Wenbin Li, Zhengxiang Shen, Runze Qi, and Jun Yu

Key Laboratory of Advanced Micro-Structured Materials, Ministry of Education, Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China

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Zhanshan Wang, Qiushi Huang, Zhong Zhang, Shengzhen Yi, Wenbin Li, Zhengxiang Shen, Runze Qi, Jun Yu. Extreme Ultraviolet, X-Ray and Neutron Thin Film Optical Components and Systems[J]. Acta Optica Sinica, 2021, 41(1): 0131001

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Paper Information

Category: Thin Films

Received: Dec. 13, 2020

Accepted: Dec. 23, 2020

Published Online: Feb. 23, 2021

The Author Email: Wang Zhanshan (wangzs@tongji.edu.cn)

DOI:10.3788/AOS202141.0131001

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