High-speed dual-view band-limited illumination profilometry using temporally interlaced acquisition

Cheng Jiang; Patrick Kilcullen; Yingming Lai; Tsuneyuki Ozaki; Jinyang Liang

doi:10.1364/PRJ.399492

Photonics Research, Volume. 8, Issue 11, 1808(2020)

High-speed dual-view band-limited illumination profilometry using temporally interlaced acquisition

Cheng Jiang^1、†, Patrick Kilcullen^1、†, Yingming Lai, Tsuneyuki Ozaki, and Jinyang Liang^*

Centre Énergie Matériaux Télécommunications, Institut National de la Recherche Scientifique, 1650 boulevard Lionel-Boulet, Varennes, Québec J3X1S2, Canada

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Cheng Jiang, Patrick Kilcullen, Yingming Lai, Tsuneyuki Ozaki, Jinyang Liang, "High-speed dual-view band-limited illumination profilometry using temporally interlaced acquisition," Photonics Res. 8, 1808 (2020)

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Paper Information

Category: Imaging Systems, Microscopy, and Displays

Received: Jun. 4, 2020

Accepted: Sep. 20, 2020

Published Online: Oct. 30, 2020

The Author Email: Jinyang Liang (jinyang.liang@emt.inrs.ca)

DOI:10.1364/PRJ.399492

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology