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Microelectronics, Volume. 55, Issue 1, 34(2025)

SEFI Characterization of High Speed JESD204B Interface Digital-to-analog Converter

LI Jing1, JIANG Wei1, LIU Jun1, YU Zhou1, WEN Xianchao1, WANG Jianan1, GUO Gang2, SUN Yi3, and WANG Tianqi4
Author Affiliations
  • 1College Chongqing GigaChip Technology Co. Ltd, Chongqing 400060, P. R. China
  • 2Institute China Institute of Atomic Energy, Beijing 102400, P. R. China
  • 3Beijing Satellite Environmental Engineering Research Institute, Beijing 102400, P. R. China
  • 4Space Environment Simulation Research Infrastructure, Harbin, 150000, P. R. China
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    LI Jing, JIANG Wei, LIU Jun, YU Zhou, WEN Xianchao, WANG Jianan, GUO Gang, SUN Yi, WANG Tianqi. SEFI Characterization of High Speed JESD204B Interface Digital-to-analog Converter[J]. Microelectronics, 2025, 55(1): 34

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    Paper Information

    Special Issue:

    Received: Oct. 22, 2024

    Accepted: Jun. 19, 2025

    Published Online: Jun. 19, 2025

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.240380

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology