Infrared and Laser Engineering, Volume. 46, Issue 9, 921003(2017)

Physical model of optical constants of SiO2 thin films

Liu Huasong1,2、*, Yang Xiao1, Liu Dandan1, Wang Lishuan1,2, Jiang Chenghui1, Jiang Yugang1, Ji Yiqin1,2, Zhang Feng1, and Chen Deying2
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    Liu Huasong, Yang Xiao, Liu Dandan, Wang Lishuan, Jiang Chenghui, Jiang Yugang, Ji Yiqin, Zhang Feng, Chen Deying. Physical model of optical constants of SiO2 thin films[J]. Infrared and Laser Engineering, 2017, 46(9): 921003

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    Paper Information

    Category: 先进光学材料

    Received: Jan. 5, 2017

    Accepted: Feb. 13, 2017

    Published Online: Nov. 17, 2017

    The Author Email: Huasong Liu (liubuasong@hotmail.com)

    DOI:10.3788/irla201746.0921003

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