Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Laser & Optoelectronics Progress, Volume. 52, Issue 3, 31202(2015)

Research on Method to Measure Cotton Defects Based on Optoelectronic Technique

Zhang Zhifeng1、*, Zhai Yusheng1, Guo Yingying2, Wang Xinjie2, and Du Yinxiao3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
    • show less
    AbstractGet PDF(in Chinese)
    Figures&Tables (0)
    Equations (0)
    References (16)
    Cited By (1)
    Tools
    Paper Information
    Topics
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    Zhang Zhifeng, Zhai Yusheng, Guo Yingying, Wang Xinjie, Du Yinxiao. Research on Method to Measure Cotton Defects Based on Optoelectronic Technique[J]. Laser & Optoelectronics Progress, 2015, 52(3): 31202

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jun. 12, 2014

    Accepted: --

    Published Online: Feb. 5, 2015

    The Author Email: Zhang Zhifeng (zhifengzhang76@gmail.com)

    DOI:10.3788/lop52.031202

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology