Chinese Optics Letters, Volume. 21, Issue 4, 041201(2023)
Wavefront measurement of a multilens optical system based on phase measuring deflectometry
Fig. 1. Schematic of our method. (a) Layout of the setup; (b) the part from PP1 to PP2 is squeezed into a new paraxial plane, CPP, which plays the role of the camera lens in (b).
Fig. 3. Simulation of wavefront reconstruction. (a) Simulated wavefront of the multilens optical system; (b) schematic of the simulated measurement setup. (c)–(g) Results when the screen was expressed as (c) z = 0.1x + 0.2y + 1000, (d) z = 0.1x + 0.2y + 2000, (e) z = 0.1x + 0.2y + 8000, (f) z = 0.3x + 0.3y + 2000, and (g) z = 0.4x + 0.4y + 2000; (h) errors between (a) and (e).
Fig. 4. Measurement process. (a) Measurement setup and the test collimator; (b) pictures acquired when using the temporal phase unwrapping.
Fig. 5. Test results (the first eight Zernike terms removed). (a)–(e) Wavefronts at the positions with the angles of 0°, 72°, 144°, 216°, and 288°; (f) interferometry result at 288°.
Fig. 6. Devices and simplified imaging models of the double calibration when the screen was put (a), (c) behind and (b), (d) in front of c′.
Fig. 7. Measurement process. (a) Measurement setup and the test SLR prime lens; (b) pictures acquired when using the temporal phase unwrapping.
Fig. 8. Test results (the first eight Zernike terms removed). (a)–(e) Wavefronts at the positions with the angles of 0°, 72°, 144°, 216°, and 288°; (f) interferometry result at 288°.
Fig. 9. Diagram of the internal sublenses in the test SLR zoom lens.
Fig. 10. Test results (the first eight Zernike terms removed). (a)–(e) Wavefronts at the angular positions with five rotation angles (0°, 72°, 144°, 216°, and 288°) under 18 mm focal length; (f)–(j) wavefronts at the angular positions with five rotation angles (0°, 72°, 144°, 216°, and 288°) under 55 mm focal length.
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Zhenyi Chen, Wenchuan Zhao, Qican Zhang, Jin Peng, Junyong Hou, "Wavefront measurement of a multilens optical system based on phase measuring deflectometry," Chin. Opt. Lett. 21, 041201 (2023)
Category: Instrumentation, Measurement, and Optical Sensing
Received: Jul. 14, 2022
Accepted: Nov. 25, 2022
Published Online: Apr. 10, 2023
The Author Email: Zhenyi Chen (13628045693@163.com)