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Laser & Optoelectronics Progress, Volume. 61, Issue 15, 1512003(2024)

Quadratic Peak-Seeking Algorithm to Improve The Frequency Shift Positioning Accuracy of Brillouin Optical Time Domain Reflectometer

Yingkai Chen1, Liping Chen2, Yonghong Zheng3, Bo Gao4, Yongzheng Li3、***, Linlin Fu5, Xinyu Liu1, Dingyi Ma1, Haoran Gao1, Qiuming Huang1, Linfeng Guo1,6、*, and Xiaomin Xu7、**
Author Affiliations
  • 1School of Physics and Optoelectronic Engineering, Nanjing University of Information Science & Technology, Nanjing 210044, Jiangsu, China
  • 2China Railway (Shanghai) Investment Group Co., Ltd., Shanghai 200126, China
  • 3China Railway No.3 Group East China Construction Co., Ltd., Nanjing 211153, Jiangsu, China
  • 4Nanjing Metro Construction Co., Ltd., Nanjing 210019, Jiangsu, China
  • 5China Railway Tunnel Group No.2 Co., Ltd., Langfang 065200, Hebei, China
  • 6Jiangsu Key Laboratory for Optoelectronic Detection of Atmosphere and Ocean, Nanjing 210044, Jiangsu, China
  • 7Department of Engineering, University of Cambridge, Cambridge CB2 1PZ, United Kingdom
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    Article index updated: Sep. 8, 2025

    The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)
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    Yingkai Chen, Liping Chen, Yonghong Zheng, Bo Gao, Yongzheng Li, Linlin Fu, Xinyu Liu, Dingyi Ma, Haoran Gao, Qiuming Huang, Linfeng Guo, Xiaomin Xu. Quadratic Peak-Seeking Algorithm to Improve The Frequency Shift Positioning Accuracy of Brillouin Optical Time Domain Reflectometer[J]. Laser & Optoelectronics Progress, 2024, 61(15): 1512003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Aug. 24, 2023

    Accepted: Sep. 6, 2023

    Published Online: Aug. 8, 2024

    The Author Email: Yongzheng Li (liyongzhengzt@163.com), Linfeng Guo (guolf_nj@163.com), Xiaomin Xu (xx787@eng.cam.ac.uk)

    DOI:10.3788/LOP231978

    CSTR:32186.14.LOP231978

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology