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Acta Optica Sinica, Volume. 22, Issue 1, 118(2002)

Soft X-Ray Contact Microscopy by an Atomic Force Microscope

Jiang Shiping1,2, Zhang Yuxuan3, Gao Hongyi2, Chen Jianwen2, Zhang Xinyi1, and Xu Zhizhan2
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  • 1[in Chinese]
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  • 3[in Chinese]
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    Jiang Shiping, Zhang Yuxuan, Gao Hongyi, Chen Jianwen, Zhang Xinyi, Xu Zhizhan. Soft X-Ray Contact Microscopy by an Atomic Force Microscope[J]. Acta Optica Sinica, 2002, 22(1): 118

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    Paper Information

    Received: Sep. 15, 2000

    Accepted: --

    Published Online: Aug. 12, 2020

    The Author Email:

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology