Direct characterization of coherence of quantum detectors by sequential measurements

Liang Xu; Huichao Xu; Jie Xie; Hui Li; Lin Zhou; Feixiang Xu; Lijian Zhang

doi:10.1117/1.AP.3.6.066001

Advanced Photonics, Volume. 3, Issue 6, 066001(2021)

Direct characterization of coherence of quantum detectors by sequential measurements

Liang Xu^{1,2,3,4,5、†}, Huichao Xu^1,2,3,4,6, Jie Xie^1,2,3,4, Hui Li^1,2,3,4, Lin Zhou^1,2,3,4, Feixiang Xu^1,2,3,4, and Lijian Zhang^1,2,3,4、*

Author Affiliations

¹Nanjing University, College of Engineering and Applied Sciences, Nanjing, China

²Nanjing University, Collaborative Innovation Center of Advanced Microstructures, Nanjing, China

³Nanjing University, National Laboratory of Solid State Microstructures, Nanjing, China

⁴Nanjing University, Key Laboratory of Intelligent Optical Sensing and Manipulation, Nanjing, China

⁵Research Center for Quantum Sensing, Zhejiang Laboratory, Hangzhou, China

⁶Purple Mountain Laboratories, Nanjing, China

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Liang Xu, Huichao Xu, Jie Xie, Hui Li, Lin Zhou, Feixiang Xu, Lijian Zhang, "Direct characterization of coherence of quantum detectors by sequential measurements," Adv. Photon. 3, 066001 (2021)

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Paper Information

Category: Research Articles

Received: Sep. 3, 2021

Accepted: Nov. 4, 2021

Published Online: Nov. 30, 2021

The Author Email: Zhang Lijian (lijian.zhang@nju.edu.cn)

DOI:10.1117/1.AP.3.6.066001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology