Laser & Optoelectronics Progress, Volume. 59, Issue 7, 0712003(2022)

Calibration Method of Fluorescence Excited Light Path in Nucleic Acid Detection System

Manshu Du1,2, Xiaohui Lin1、*, Jiayu Yang2, Jianchun Liu1, and Dongxu Zhang2
Author Affiliations
  • 1School of Electrical Engineering and Automation, Xiamen Institute of Technology, Xiamen , Fujian 361024, China
  • 2Shool of Public Health, Xiamen University, Xiamen , Fujian 361102, China
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    Figures & Tables(11)
    Structure diagram of optical system of nucleic acid detection instrument
    Schematic of excitation light path
    Relation curve between exit angle of light source and radius of light at edge of secondary refraction surface
    Relation curve between exit angle of light source and exit angle of secondary refraction surface
    ZEMAX simulation results
    Experimental setup for measuring light spot
    Images taken by CCD with five different apertures
    Changes of exit spot radius of excitation light path under different apertures
    Images taken by CCD of optical path collimation experiments under different distances between screen and lens. (a) 7.7 mm; (b) 8.7 mm
    • Table 1. Parameters table of numerical calculation system for spot radius

      View table

      Table 1. Parameters table of numerical calculation system for spot radius

      r1 /mmr2 /mmn1n2l/mmg/mm
      5.171.01.57.37.7
    • Table 2. Experimental data of collimation of excitation light path

      View table

      Table 2. Experimental data of collimation of excitation light path

      ExperimentDistance /mmSpot radius /dpiReference size /dpiActual size /mmExit angle /(°)
      17.724.9711.42.19-2.86
      8.724.3811.42.14
      27.724.6911.22.20-1.72
      8.724.7911.42.17
      37.724.7911.32.19-0.57
      8.724.6611.32.18
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    Manshu Du, Xiaohui Lin, Jiayu Yang, Jianchun Liu, Dongxu Zhang. Calibration Method of Fluorescence Excited Light Path in Nucleic Acid Detection System[J]. Laser & Optoelectronics Progress, 2022, 59(7): 0712003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: May. 19, 2021

    Accepted: Jul. 1, 2021

    Published Online: Mar. 8, 2022

    The Author Email: Xiaohui Lin (xhxmut@163.com)

    DOI:10.3788/LOP202259.0712003

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