Optical Instruments, Volume. 46, Issue 6, 9(2024)

Mapping the multi-component of near fields using nanoparticles

Zhiyuan MA1,2, Fanfei MENG2、*, Aiping YANG3, and Zhifeng CHEN1、*
Author Affiliations
  • 1School of Physics and Materials Science, Guangzhou University, Guangzhou 510006, China
  • 2School of Physical Sciences, Great Bay University, Dongguan 523000, China
  • 3School of Materials Science and Engineering, Dongguan University of Technology, Dongguan 523808, China
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    Figures & Tables(20)
    Near-field probe of NSOM
    Specialized apertures of NSOM probe
    Specialized scatter tips for near-field probes
    Schematic diagram for mapping SPP near fields using nanoparticles
    Far-field projection of PS nanoparticles as near-field probes and collection efficiency
    Measured SPP using PS nanoparticles with different diameters and theoretical calculations
    Schematic diagram of the gap mode system of NP-metal film under SERS and the gap mode diagram of metal particle-metal film
    Comparison of scanned SPP field intensity distribution focused by various incident vector beams and theoretical calculations
    Schematic diagram of silicon nanoparticles as near-field probes, resonance spectrum, and magnetic dipole resonance mode distribution
    Far-field radiation projection of silicon nanoparticles irradiated by three components of TE mode
    Principle of anapole resonance in silver core-silicon shell nanoparticles
    Measured and theoretical distribution of in-plane magnetic field for tightly focused polarized beams
    Schematic diagram of the system for characterizing the electromagnetic field components of tightly focused beams
    Characterization of different components of focused beam by Au/Ag particles on film
    Detection principle of two mode waveguide probe for three electric field components
    Measured and calculated results of tightly focused AP and RP beams
    WMCE radiation characteristics of silicon nanoparticles on MDW
    WMCE spectra and scanning and calculating intensity distribution of tightly focused AP beams
    Gold nanoparticles combined with Mie scattering theory to reconstruct the focus field distribution(top left), measurement of transverse spin density(TSD)using silicon nanoparticles(top right), and electromagnetic field component detection using silicon particle on a fiber probe tip(bottom).
    • Table 1. Summary of multi-parameter near-field imaging techniques based on nanoparticles

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      Table 1. Summary of multi-parameter near-field imaging techniques based on nanoparticles

      SPPs分量表征紧聚焦光场表征
      颗粒功能效果颗粒-波导结构功能效果
      PS颗粒面内电场★★★★★金颗粒−银膜面内电场★★★★★
      面外电场★★★★★银颗粒−银膜面外电场★★★★★
      面外磁场★★★PS颗粒−金属介质波导同时表征3种正交电场分量★★★★
      硅壳−银核面内磁场★★★★★硅颗粒−金属介质波导选择性提取磁场分量★★★★
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    Zhiyuan MA, Fanfei MENG, Aiping YANG, Zhifeng CHEN. Mapping the multi-component of near fields using nanoparticles[J]. Optical Instruments, 2024, 46(6): 9

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    Paper Information

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    Received: Oct. 29, 2024

    Accepted: --

    Published Online: Jan. 21, 2025

    The Author Email: MENG Fanfei (mengfanfei@gbu.edu.cn), CHEN Zhifeng (chenzf@gzhu.edu.cn)

    DOI:10.3969/j.issn.1005-5630.202410290097

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