Optical Instruments, Volume. 46, Issue 6, 9(2024)
Mapping the multi-component of near fields using nanoparticles
Fig. 4. Schematic diagram for mapping SPP near fields using nanoparticles
Fig. 5. Far-field projection of PS nanoparticles as near-field probes and collection efficiency
Fig. 6. Measured SPP using PS nanoparticles with different diameters and theoretical calculations
Fig. 7. Schematic diagram of the gap mode system of NP-metal film under SERS and the gap mode diagram of metal particle-metal film
Fig. 8. Comparison of scanned SPP field intensity distribution focused by various incident vector beams and theoretical calculations
Fig. 9. Schematic diagram of silicon nanoparticles as near-field probes, resonance spectrum, and magnetic dipole resonance mode distribution
Fig. 10. Far-field radiation projection of silicon nanoparticles irradiated by three components of TE mode
Fig. 11. Principle of anapole resonance in silver core-silicon shell nanoparticles
Fig. 12. Measured and theoretical distribution of in-plane magnetic field for tightly focused polarized beams
Fig. 13. Schematic diagram of the system for characterizing the electromagnetic field components of tightly focused beams
Fig. 14. Characterization of different components of focused beam by Au/Ag particles on film
Fig. 15. Detection principle of two mode waveguide probe for three electric field components
Fig. 16. Measured and calculated results of tightly focused AP and RP beams
Fig. 17. WMCE radiation characteristics of silicon nanoparticles on MDW
Fig. 18. WMCE spectra and scanning and calculating intensity distribution of tightly focused AP beams
Fig. 19. Gold nanoparticles combined with Mie scattering theory to reconstruct the focus field distribution(top left), measurement of transverse spin density(TSD)using silicon nanoparticles(top right), and electromagnetic field component detection using silicon particle on a fiber probe tip(bottom).
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Zhiyuan MA, Fanfei MENG, Aiping YANG, Zhifeng CHEN. Mapping the multi-component of near fields using nanoparticles[J]. Optical Instruments, 2024, 46(6): 9
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Received: Oct. 29, 2024
Accepted: --
Published Online: Jan. 21, 2025
The Author Email: MENG Fanfei (mengfanfei@gbu.edu.cn), CHEN Zhifeng (chenzf@gzhu.edu.cn)