Oxide perovskite Ba<sub>2</sub>AgIO<sub>6</sub> wafers for X-ray detection

Longbo YANG; Jincong PANG; Zhifang TAN; Qi XIAO; Tong JIN; Jiajun LUO; Guangda NIU; Jiang TANG

doi:10.1007/s12200-021-1236-y

Frontiers of Optoelectronics, Volume. 14, Issue 4, 473(2021)

Oxide perovskite Ba₂AgIO₆ wafers for X-ray detection

Longbo YANG, Jincong PANG, Zhifang TAN, Qi XIAO, Tong JIN, Jiajun LUO^*, Guangda NIU, and Jiang TANG

Wuhan National Laboratory for Optoelectronics (WNLO), School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China

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Longbo YANG, Jincong PANG, Zhifang TAN, Qi XIAO, Tong JIN, Jiajun LUO, Guangda NIU, Jiang TANG. Oxide perovskite Ba₂AgIO₆ wafers for X-ray detection[J]. Frontiers of Optoelectronics, 2021, 14(4): 473

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Paper Information

Category: RESEARCH ARTICLE

Received: Apr. 23, 2021

Accepted: Jun. 3, 2021

Published Online: Jan. 10, 2022

The Author Email: Jiajun LUO (luojiajun@mail.hust.edu.cn)

DOI:10.1007/s12200-021-1236-y

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology