Topological Landau–Zener nanophotonic circuits

Bing-Cong Xu; Bi-Ye Xie; Li-Hua Xu; Ming Deng; Weijin Chen; Heng Wei; Fengliang Dong; Jian Wang; Cheng-Wei Qiu; Shuang Zhang; Lin Chen

doi:10.1117/1.AP.5.3.036005

Advanced Photonics, Volume. 5, Issue 3, 036005(2023)

Topological Landau–Zener nanophotonic circuits

Bing-Cong Xu^1、†, Bi-Ye Xie², Li-Hua Xu³, Ming Deng¹, Weijin Chen⁴, Heng Wei⁴, Fengliang Dong^3,5、*, Jian Wang¹, Cheng-Wei Qiu^4、*, Shuang Zhang^6、*, and Lin Chen^1,7、*

Author Affiliations

¹Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China

²The Chinese University of Hong Kong, School of Science and Engineering, Shenzhen, China

³CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology of China, Nanofabrication Laboratory, CAS Key Laboratory for Nanosystems and Hierarchical Fabrication, CAS Key Laboratory for Nanophotonic Materials and Devices, Beijing, China

⁴National University of Singapore, Department of Electrical and Computer Engineering, Singapore

⁵University of Chinese Academy of Sciences, Center of Materials Science and Optoelectronics Engineering, Beijing, China

⁶The University of Hong Kong, Department of Physics, Hong Kong, China

⁷Peking University, School of Physics, State Key Laboratory for Mesoscopic Physics, Beijing, China

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Bing-Cong Xu, Bi-Ye Xie, Li-Hua Xu, Ming Deng, Weijin Chen, Heng Wei, Fengliang Dong, Jian Wang, Cheng-Wei Qiu, Shuang Zhang, Lin Chen, "Topological Landau–Zener nanophotonic circuits," Adv. Photon. 5, 036005 (2023)

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Paper Information

Category: Research Articles

Received: Feb. 1, 2023

Accepted: May. 4, 2023

Published Online: Jun. 2, 2023

The Author Email: Dong Fengliang (dongfl@nanoctr.cn), Qiu Cheng-Wei (chengwei.qiu@nus.edu.sg), Zhang Shuang (shuzhang@hku.hk), Chen Lin (chen.lin@mail.hust.edu.cn)

DOI:10.1117/1.AP.5.3.036005

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology