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Chinese Journal of Lasers, Volume. 23, Issue 4, 338(1996)

Measurement of the Thickess and Dielectric Constants of Metal Films by Surface Plasma Wave Excited with One Wavelength

[in Chinese]1, [in Chinese]2, [in Chinese]1, and [in Chinese]1
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of the Thickess and Dielectric Constants of Metal Films by Surface Plasma Wave Excited with One Wavelength[J]. Chinese Journal of Lasers, 1996, 23(4): 338

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    Received: May. 17, 1995

    Accepted: --

    Published Online: Dec. 4, 2006

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology