Chinese Journal of Lasers, Volume. 23, Issue 4, 338(1996)
Measurement of the Thickess and Dielectric Constants of Metal Films by Surface Plasma Wave Excited with One Wavelength
In this paper, the surface plasma wave (SPW) on the interface of medal-electricmedium was excited with one wavelength by using the angle scanning ATR method and thethickness and dielectric constants of metal films were measured by a nonlinear least-squarecure-fitting method.
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of the Thickess and Dielectric Constants of Metal Films by Surface Plasma Wave Excited with One Wavelength[J]. Chinese Journal of Lasers, 1996, 23(4): 338
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