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Microelectronics, Volume. 52, Issue 6, 1090(2022)

A Low-Overhead On-Chip Aging Measurement Scheme for Bypass Reconfiguration RO

MA Junxiang1, LIANG Huaguo1, LI Danqing1, YI Maoxiang1, LU Yingchun1, and JIANG Cuiyun2
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    MA Junxiang, LIANG Huaguo, LI Danqing, YI Maoxiang, LU Yingchun, JIANG Cuiyun. A Low-Overhead On-Chip Aging Measurement Scheme for Bypass Reconfiguration RO[J]. Microelectronics, 2022, 52(6): 1090

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    Received: Dec. 22, 2021

    Accepted: --

    Published Online: Mar. 11, 2023

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.210500

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology