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Photonics Research, Volume. 8, Issue 12, 1862(2020)

High detectivity photodetectors based on perovskite nanowires with suppressed surface defects

Guohui Li1、†, Rui Gao1、†, Yue Han1, Aiping Zhai1, Yucheng Liu2, Yue Tian1, Bining Tian1, Yuying Hao1, Shengzhong Liu2,3,4,5, Yucheng Wu1,6, and Yanxia Cui1、*
Author Affiliations
  • 1College of Physics and Optoelectronics, Key Laboratory of Advanced Transducers and Intelligent Control System of Ministry of Education, Key Laboratory of Interface Science and Engineering in Advanced Materials of Ministry of Education, Taiyuan University of Technology, Taiyuan 030024, China
  • 2Key Laboratory of Applied Surface and Colloid Chemistry, MOE; Shaanxi Key Laboratory for Advanced Energy Devices; Shaanxi Engineering Laboratory for Advanced Energy Technology, School of Materials Science and Engineering, Shaanxi Normal University, Xi’an 710119, China
  • 3Dalian National Laboratory for Clean Energy; iChEM, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China
  • 4University of Chinese Academy of Sciences, Beijing 100049, China
  • 5e-mail: liusz@snnu.edu.cn
  • 6e-mail: wyc@tyut.edu.cn
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    CLP Journals

    [1] Qingyun He, Enrou Mei, Ze Wang, Xiaojuan Liang, Suqin Chen, Weidong Xiang, "Ultrastable Gd3+ doped CsPbCl1.5Br1.5 nanocrystals blue glass for regulated and low thresholds amplified spontaneous emission," Photonics Res. 9, 1916 (2021)

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    Guohui Li, Rui Gao, Yue Han, Aiping Zhai, Yucheng Liu, Yue Tian, Bining Tian, Yuying Hao, Shengzhong Liu, Yucheng Wu, Yanxia Cui, "High detectivity photodetectors based on perovskite nanowires with suppressed surface defects," Photonics Res. 8, 1862 (2020)

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    Paper Information

    Category: Optical and Photonic Materials

    Received: Jul. 27, 2020

    Accepted: Sep. 28, 2020

    Published Online: Nov. 19, 2020

    The Author Email: Yanxia Cui (yanxiacui@gmail.com)

    DOI:10.1364/PRJ.403030

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology