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Photonics Research, Volume. 13, Issue 1, 210(2025)

In situ spontaneous emission control of MoSe2-WSe2 interlayer excitons with high quantum yield

Bo Han1、†, Chirag C. Palekar2、†, Frederik Lohof3, Sven Stephan1,4, Victor N. Mitryakhin1, Jens-Christian Drawer1, Alexander Steinhoff3, Lukas Lackner1, Martin Silies1,4, Bárbara Rosa2, Martin Esmann1, Falk Eilenberger5,6,7, Christopher Gies1,8、*, Stephan Reitzenstein2,9、*, and Christian Schneider1,10、*
Author Affiliations
  • 1Institut für Physik, Fakultät V, Carl von Ossietzky Universität Oldenburg, 26129 Oldenburg, Germany
  • 2Institut für Festkörperphysik, Technische Universität Berlin, 10623 Berlin, Germany
  • 3Institute for Theoretical Physics and Bremen Center for Computational Material Science, Universität Bremen, 28359 Bremen, Germany
  • 4Institute for Lasers and Optics, Hochschule Emden/Leer, 26723 Emden, Germany
  • 5Fraunhofer-Institute for Applied Optics and Precision Engineering IOF, 07745 Jena, Germany
  • 6Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller Universität Jena, 07745 Jena, Germany
  • 7Max Planck School of Photonics, 07745 Jena, Germany
  • 8e-mail: christopher.gies@uni-oldenburg.de
  • 9e-mail: stephan.reitzenstein@physik.tu-berlin.de
  • 10e-mail: christian.schneider@uni-oldenburg.de
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    Bo Han, Chirag C. Palekar, Frederik Lohof, Sven Stephan, Victor N. Mitryakhin, Jens-Christian Drawer, Alexander Steinhoff, Lukas Lackner, Martin Silies, Bárbara Rosa, Martin Esmann, Falk Eilenberger, Christopher Gies, Stephan Reitzenstein, Christian Schneider, "In situ spontaneous emission control of MoSe2-WSe2 interlayer excitons with high quantum yield," Photonics Res. 13, 210 (2025)

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    Paper Information

    Category: Optical and Photonic Materials

    Received: Aug. 21, 2024

    Accepted: Nov. 4, 2024

    Published Online: Dec. 26, 2024

    The Author Email: Christopher Gies (christopher.gies@uni-oldenburg.de), Stephan Reitzenstein (stephan.reitzenstein@physik.tu-berlin.de), Christian Schneider (christian.schneider@uni-oldenburg.de)

    DOI:10.1364/PRJ.540127

    CSTR:32188.14.PRJ.540127

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology