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Journal of Optoelectronics · Laser, Volume. 34, Issue 7, 752(2023)

Defect detection of key components of electric multiple units based on improved YOLOv5

XU Guowei1,2、*, LIN Hui1, XIU Chunbo1,3, YANG Nan1, and LIU Mingyang1
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    XU Guowei, LIN Hui, XIU Chunbo, YANG Nan, LIU Mingyang. Defect detection of key components of electric multiple units based on improved YOLOv5[J]. Journal of Optoelectronics · Laser, 2023, 34(7): 752

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    Paper Information

    Received: May. 20, 2022

    Accepted: --

    Published Online: Sep. 25, 2024

    The Author Email: XU Guowei (xuguowei@tiangong.edu.cn)

    DOI:10.16136/j.joel.2023.07.0374

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology