[1] [1] Malacara D. Optical Shop Testing[J]. Applied Optics， 2007， 97(591)： 454-464.

[2] [2] Jérme Primot. Theoretical description of Shack-Hartmann wave-front sensor[J]. Optics Communications， 2003， 222(1-6)： 81-92.

[3] [3] Malacara-Doblado D，Ghozeil I. Hartmann-Shack， and other screen tests[J]. Optical Shop Testing， 2007， 3： 361-397.

[4] [4] Strojnik M， Paez G， Mantravadi M. Lateral shear interferometers[J]. Optical Shop Testing， 2007， (5)： 122-184.

[5] [5] Canabal H， Quiroga J A， Bernabeu E. Improved phase-shifting method for automatic processing of Moiré deflectograms[J]. Applied Optics， 1998， 37(26)： 6227-6233.

[6] [6] Legarda-Saenz R. Robust wavefront estimation using multiple directional derivatives in moiré deflectometry[J]. Optics and Lasers in Engineering， 2007， 45(9)： 915-921.

[7] [7] Su X Y， Zhou W S， Von Bally G， et al. Automated phase-measuring profilometry using defocused projection of a Ronchi grating[J]. Optics Communications， 1992， 94(6)： 561-573.

[8] [8] Petz M， Fischer M， Tutsch R. Three-dimensional shape measurement of aspheric refractive optics by pattern transmission photogrammetry[C] //Three-Dimensional Imaging Metrology. International Society for Optics and Photonics， 2009， 7239： 723906.

[9] [9] Knauer M C， Richter C， Husler G. Measuring the refractive power with deflectometry in transmission[C]. DGaO-Proc. 109 A， 2008， 24： 2008.

[10] [10] Flores J L， Legarda-Saenz R， Garcia-Torales G. Color deflectometry for phase retrieval using phase-shifting methods[J]. Optics Communications， 2015， 334： 298-302.

[11] [11] Yu J， Fang F， Qiu Z. Aberrations measurement of freeform spectacle lenses based on Hartmann wavefront technology[J]. Applied Optics， 2015， 54(5)： 986.

[12] [12] Knauer M C， Kaminski J， Husler G. Phase measuring deflectometry： A new approach to measure specular free-form surfaces[C]//Optical Metrology in Production Engineering. International Society for Optics and Photonics， 2004， 5457： 366-376.

[13] [13] Kewei E， Li D， Yang L， et al. Novel method for high accuracy figure measurement of optical flat[J]. Optics and Lasers in Engineering， 2017， 88(Complete)： 162-166.

[14] [14] Canabal H A， Alonso J. Automatic wavefront measurement technique using a computer display and a charge-coupled device camera[J]. Optical Engineering， 2002， 41(4)： 822-826.

[15] [15] Lili J， Xiaodong Z， Fengzhou F， et al. Wavefront aberration metrology based on transmitted fringe deflectometry[J]. Applied Optics， 2017， 56(26)：7396.

[16] [16] Wang D， Xu P， Gong Z， et al. Transmitted wavefront testing with large dynamic range based on computer-aided deflectometry[J]. Journal of Optics (IOP science)， 2018， 20(6)： 55-57.

[17] [17] Smith W J. Modern optical engineering[M]. 3rd ed. New York： McGraw-Hill， 2004.

[18] [18] Welford W T. Aberrations of optical systems[M]. Bristo： Adam Hilger Ltd.， 1986.

[20] [20] Li M， Li D， Zhang C， et al. Modal wavefront reconstruction from slope measurements for rectangular apertures[J]. JOSA A， 2015， 32(11)： 1916-1921.