Laser & Optoelectronics Progress, Volume. 62, Issue 17, 1739008(2025)

Review of Optical Vector Analysis Techniques for Intelligent Optical Computing Chips (Invited)

Shuran Zhang, Yunping Bai*, Jiajia Wang, Shuying Li, Xuecheng Zeng, Xingyuan Xu**, and Kun Xu***
Author Affiliations
  • State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications, Beijing 100876, China
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    Figures & Tables(16)
    Schematic diagram of principle for direct optical vector analysis technique based on broadband electrical modulation
    Schematic diagram of principle for indirect optical vector analysis technique
    Schematic diagram of optical vector network analyzer based on optical interference[12]
    Schematic diagram of optical vector analysis technique based on optical interference
    Schematic diagram of the OVA based on SSB modulation[27]
    Measurement results of spectral response for an ultra-narrow band phase-shifted FBG[27]. (a) Measurement results of magnitude response; (b) measurement results of phase response
    Architecture of OVA based on optical frequency comb and asymmetric DSB modulation[73]
    Structure and principle of optical vector analysis technique based on dual-radio-frequency modulation[80]. (a) Structure schematic diagram of the dual-radio-frequency modulation scheme; (b) principle of time to frequency conversion based on dual-radio-frequency modulation
    Schematic diagram of frequency calibration based on fiber resonator[10]
    Spectra of branches and structure of optical vector analysis based on resonator calibration[10]. (a) Spectra of branches; (b) schematic diagram of the structure
    Schematic diagram of phase measurement scheme based on Kramers-Kronig relationship[37]
    Schematic diagram of optical vector analysis based on fractional delay scheme[38]
    Schematic diagram of optical vector analysis for a four-tap FIR filter[38]. (a) Chip architecture; (b) chip layout; (c) insertion loss spectrum after normalization; (d) photomicrograph; (e) recovered impulse response and measured impulse response amplitude using commercial equipment; (f) powers and phases of the four taps as a function of the electrical power applied onto phase shifter 1; (g) spectral characteristics of SPC; (h) phases of the four taps as a function of electrical power
    Schematic diagrams of optical vector analysis based on long delay reference path. (a) Schematic diagram of optical vector analysis scheme; (b) schematic diagram of time-domain signal
    Experimental results for on-chip Kramers-Kronig phase recovery[37]. (a) Layout of the 16-tap FIR chip; (b) photo of the fabricated chip; (c) packaged chip; (d) measured powers of the 16 taps; (e) power splitting ratio of MZIs 4‒8; (f) measured phases of the 16 taps; (g) phase of phase shifter 16; (h) measured insertion loss spectrum of a certain configuration of the tap coefficient; (i) phase response recovered via Hilbert transform; (j) power and (k) phase of the impulse response or tap coefficient recovered from inverse Fourier transform of the frequency response, or measured using an OVA; (l) poles and zeros recovered via a Z-transform of the frequency response
    • Table 1. Comparison of characteristics and application scenarios of different optical vector analysis techniques

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      Table 1. Comparison of characteristics and application scenarios of different optical vector analysis techniques

      TypeAdvantagesDisadvantagesApplication scenarios
      OVA based on optical interferenceShort laser scanning time (μs-level); high sensitivity; capable of acquiring polarization state; kHz-level measurement resolution

      Environmentally sensitive;

      non-linear chirp generation in laser; spectral aliasing phenomenon; limited measurement bandwidth (within 20 GHz)

      High measurement accuracy demand; small measurement bandwidth; stable test environment
      OVA based on SSB modulationFree from frequency-domain aliasing phenomena;high frequency resolution (kHz-level)Limited measurement bandwidth (less than 40 GHz);sideband residual issue; higher-order sideband distortion; complex signal processing procedure; measurement time at the s-levelHigh measurement accuracy demand; limited test bandwidth
      OVA based on DSB modulationLarger single-sweep bandwidth (less than 100 GHz); Hz-level frequency resolution; avoidance of sideband residual issues; high measurement accuracy; wide dynamic range (>90 dB)Occurrence of spectral aliasing phenomena; time-consuming data processing (at the s-level); complex DSP algorithmsHigh measurement accuracy demand; limited test bandwidth
      OVA based on resonant cavity calibrationExtremely wide measurement bandwidth (THz-level); Hz-level frequency resolution; elimination of modulator or similar components in measurement process; high accuracy with low measurement uncertaintyEnvironmentally sensitive; complex frequency calibration procedure; heavy computational load in signal processing; time-consuming data processing (at the s-level)High measurement accuracy demand; wideband measurement requirements; stable measurement environment
      OVA based on reference delay pathTHz-level measurement bandwidth; rapid measurement capability (μs-level); economical test infrastructure; simplified DSP algorithmResolution-constrained frequency analysis (MHz-level); high-sensitivity reference path; lower measurement accuracyLarge bandwidth and fast measurement requirements; tolerant to optical vector analysis inaccuracies
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    Shuran Zhang, Yunping Bai, Jiajia Wang, Shuying Li, Xuecheng Zeng, Xingyuan Xu, Kun Xu. Review of Optical Vector Analysis Techniques for Intelligent Optical Computing Chips (Invited)[J]. Laser & Optoelectronics Progress, 2025, 62(17): 1739008

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    Paper Information

    Category: AI for Optics

    Received: Apr. 16, 2025

    Accepted: May. 29, 2025

    Published Online: Sep. 8, 2025

    The Author Email: Yunping Bai (baiyunping@bupt.edu.cn), Xingyuan Xu (xingyuanxu@bupt.edu.cn), Kun Xu (xukun@bupt.edu.cn)

    DOI:10.3788/LOP251032

    CSTR:32186.14.LOP251032

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