A Modified 3D Profilometry Based on Fringe Contrast

[1] [1] Mitsuo TAKEDA, Kazuhiro MUTOH. Fourier transform profilometry for the automatic measurement of 3-D object shapes [J]. Applied Optics(S1559-128X), 1983, 22(24): 3977-3982.

[2] [2] SRINIVASAN V, LIU H C, Maurice HALIOUA. Automated phase-measuring profilometry: a phase mapping approach [J]. Applied Optics(S1559-128X), 1985, 24(2): 185-188.

[3] [3] CHEN Jia-bi, SU Xian-yu. Optical information Technique-Principles&Applications [M]. Beijing: Higher Education Press, 2001.

[4] [4] SU Li-kun, SU Xian-yu, LI Wang-song, et al. 3-D profilometry based on modulation measurement [J]. Acta Optica Sinica, 1999, 19(9): 1257-1262.

[5] [5] SU Li-kun, SU Xian-yu, LI Wang-song, et al. Application of modulation measurement profilometry to objects with surface holes [J]. Applied Optics(S1559-128X), 1999, 38(7): 1153-1158.

[6] [6] SU Xian-yu, SU Li-kun, LI Wang-song. New Fourier transform profilometry based on modulation measurement [J]. Proceeding of SPIE(S0277-786X), 1999, 3749: 438-439.

[7] [7] SHAO Shuang-yun, SU Xian-yu, ZHANG Qi-can, et al. Complex object shape measurement using modulation measurement profilometry [J]. Acta Optica Sinica, 2004, 24(12): 1623-1628.

[8] [8] SHAO Shuang-yu, SU Xian-yu. New depth recovery algorithm in modulation measurement profilometry [J]. Opto-Electronic Engineering, 2005, 32(9): 43-46.

[9] [9] DOU Yun-fu, SU Xian-yu, CHEN Yan-fei. A Fast Modulation Measurement Profilometry [J]. Acta Optica Sinica, 2009, 29(7): 1858-1862.

[10] [10] CHEN Yan-fei, SU Xian-yu, DOU Yun-fu. Fast modulation measurement profilometry based on double color projections [J]. Opto-Electronic Engineering, 2009, 36(4): 17-21.

[11] [11] Yamatani K, Yamamoto M, Otani Y, et al. Three dimensional surface profilometry using structured liquid crystal grating [J]. Proceeding of SPIE(S0277-786X), 1999, 3782: 291-296.

[12] [12] Yukitoshi Otani, Fumio Kobayashi, Yasuhiro Mizutani, et al. Three-dimensional profilometry based on focus method by projecting LC grating pattern [J]. Proceeding of SPIE(S0277-786X), 2009, 7432: 743210.

[13] [13] Yukitoshi Otani, Fumio Kobayashi, Yasuhiro Mizutani, et al. Uni-axial measurement of three-dimensional surface profile by liquid crystal digital shifter [J]. Proceeding of SPIE(S0277-786X), 2010, 7790: 77900A.

[14] [14] Muralidhara Subbarao, Natarajan Gurumoorthy. Depth recovery from blurred edges [C]// Computer Society Conference on Computer Vision and Pattern Recognition, Ann Arbor, MI, USA, June 5-9, 1988: 498-503.