Photonics Research, Volume. 4, Issue 3, 00A1(2016)
Modulated orientation-sensitive terahertz spectroscopy
Fig. 1. (a) Displacement vector diagram for intramolecular vibration at
Fig. 2. Top, schematic of MOSTS optics; yellow arrows show direction of incident THz polarization. Bottom, photos of the sample rotator.
Fig. 3. MOSTS signals for an isotropic silicon wafer and for an anisotropic sample, a polarizer. (a) MOSTS time domain signal. Inset shows a standard THz TDS transmission measurement for the silicon wafer to contrast with the zero MOSTS waveform because MOSTS only measures anisotropy in the sample. (b) MOSTS field amplitude showing the broadband anisotropy of the polarizer and, again, zero signal for the isotropic silicon.
Fig. 4. Absorption coefficient and refractive index measurements of
Fig. 5. MOSTS modeling and measurements of a
Fig. 6. Absorption coefficient and refractive index measurements of
Fig. 7. MOSTS modeling and measurements of an
Fig. 8. (a) Absorption coefficient and refractive index measurements of
Fig. 9. (a) THz TDS measurements of sucrose-polycarbonate model sample with THz polarization along the
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Rohit Singh, Deepu Koshy George, Chejin Bae, K. A. Niessen, A. G. Markelz, "Modulated orientation-sensitive terahertz spectroscopy," Photonics Res. 4, 00A1 (2016)
Special Issue: TERAHERTZ PHOTONICS: APPLICATIONS AND TECHNIQUES
Received: Feb. 3, 2016
Accepted: Mar. 29, 2016
Published Online: Sep. 29, 2016
The Author Email: A. G. Markelz (amarkelz@buffalo.edu)