Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Infrared Technology, Volume. 42, Issue 6, 598(2020)

Defect Detection of Landfill Bare Film Based on Infrared Imaging Technology

Yayu CHEN*, Wei ZHAGN, Huanyi SUN, and Xiaosong HUANG
Author Affiliations
  • [in Chinese]
    • show less
    AbstractGet PDF(in Chinese)
    Figures&Tables (0)
    Equations (0)
    References (2)
    Tools
    Paper Information
    Topics
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    CHEN Yayu, ZHAGN Wei, SUN Huanyi, HUANG Xiaosong. Defect Detection of Landfill Bare Film Based on Infrared Imaging Technology[J]. Infrared Technology, 2020, 42(6): 598

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category:

    Received: Aug. 20, 2019

    Accepted: --

    Published Online: Jul. 16, 2020

    The Author Email: Yayu CHEN (121847157@qq.com)

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology