Direct observation of longitudinal aberrated wavefields

J. P. Trevino; V. Coello; A. Jaimes-Nájera; C. E. Garcia-Ortiz; S. Chávez-Cerda; J. E. Gómez-Correa

doi:10.1364/PRJ.482323

Photonics Research, Volume. 11, Issue 6, 1015(2023)

Direct observation of longitudinal aberrated wavefields

J. P. Trevino^1,2, V. Coello^3、*, A. Jaimes-Nájera¹, C. E. Garcia-Ortiz¹, S. Chávez-Cerda⁴, and J. E. Gómez-Correa⁴

Author Affiliations

¹Tecnológico de Monterrey, School of Engineering and Sciences, Monterrey NL 64849, Mexico

²Universidad Politécnica de Puebla, Cuanalá Puebla 72640, Mexico

³Centro de Investigación Científica y de Educación Superior de Ensenada, Unidad Monterrey, Apodaca NL 66629, Mexico

⁴Instituto Nacional de Astrofísica, Óptica y Electrónica, Coordinación de Óptica, Tonantzintla Puebla 72840, Mexico

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J. P. Trevino, V. Coello, A. Jaimes-Nájera, C. E. Garcia-Ortiz, S. Chávez-Cerda, J. E. Gómez-Correa, "Direct observation of longitudinal aberrated wavefields," Photonics Res. 11, 1015 (2023)

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Paper Information

Category: Imaging Systems, Microscopy, and Displays

Received: Dec. 1, 2022

Accepted: Mar. 17, 2023

Published Online: May. 29, 2023

The Author Email: V. Coello (vcoello@cicese.mx)

DOI:10.1364/PRJ.482323

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology