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Acta Optica Sinica, Volume. 38, Issue 5, 0513001(2018)

Broad-Band Polarization Characteristics on Transmission and Reflection of Metal Array Structures in Terahertz Region

Yun Shen1, Tao Wang1, Yun Wang1, Xiaohua Deng、*, Juncheng Cao1, Zhiyong Tan1, Lin'er Zou1, and Guohong Dai1
Author Affiliations
  • 1 Department of Physics, Nanchang University, Nanchang, Jiangxi 330031, China
  • 1 Institute of Space Science and Technology, Nanchang University, Nanchang, Jiangxi 330031, China
  • 1 Key Laboratory of Terahertz Solid-State Technology, Chinese Academy of Sciences, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
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    AbstractGet PDF(in Chinese)
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    Schematic of metal array structure

    Fig. 1. Schematic of metal array structure

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    (a) Reflection spectrum lines and (b) transmission spectrum lines for TM/TE mode of metal array with and without Si substrate when the parameters of the array are Px=10 μm, ax=5 μm, Py=300 μm, and ay=250 μm

    Fig. 2. (a) Reflection spectrum lines and (b) transmission spectrum lines for TM/TE mode of metal array with and without Si substrate when the parameters of the array are Px=10 μm, ax=5 μm, Py=300 μm, and ay=250 μm

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    (a) Reflection spectrum lines and (b) transmission spectrum lines for TM/TE mode of metal array with and without Si substrate when the parameters of the array are Px=20 μm, ax=10 μm, Py=300 μm, and ay=250 μm

    Fig. 3. (a) Reflection spectrum lines and (b) transmission spectrum lines for TM/TE mode of metal array with and without Si substrate when the parameters of the array are Px=20 μm, ax=10 μm, Py=300 μm, and ay=250 μm

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    Optical micrograph and partial enlarged detail of the metal array with Px=10 μm and ax=5 μm

    Fig. 4. Optical micrograph and partial enlarged detail of the metal array with Px=10 μm and ax=5 μm

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    Schematic of light path of measuring transmission spectrum lines and reflection spectrum lines

    Fig. 5. Schematic of light path of measuring transmission spectrum lines and reflection spectrum lines

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    Measured (a) reflection spectrum lines and (b) transmission spectrum lines when the parameters of metal array are Px=10 μm, ax=5 μm, and the thickness of Si substrate is 500 μm

    Fig. 6. Measured (a) reflection spectrum lines and (b) transmission spectrum lines when the parameters of metal array are Px=10 μm, ax=5 μm, and the thickness of Si substrate is 500 μm

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    Measured (a) reflection spectrum lines and (b) transmission spectrum lines when the parameters of metal array are Px=20 μm, ax=10 μm, and the thickness of Si substrate is 500 μm

    Fig. 7. Measured (a) reflection spectrum lines and (b) transmission spectrum lines when the parameters of metal array are Px=20 μm, ax=10 μm, and the thickness of Si substrate is 500 μm

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    Yun Shen, Tao Wang, Yun Wang, Xiaohua Deng, Juncheng Cao, Zhiyong Tan, Lin'er Zou, Guohong Dai. Broad-Band Polarization Characteristics on Transmission and Reflection of Metal Array Structures in Terahertz Region[J]. Acta Optica Sinica, 2018, 38(5): 0513001

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    Paper Information

    Category: Integrated Optics

    Received: Sep. 30, 2017

    Accepted: --

    Published Online: Jul. 10, 2018

    The Author Email:

    DOI:10.3788/AOS201838.0513001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology