Fig. 1. Main structure diagram of the article with angle-resolved spectrum as the core

Fig. 2. Schematic diagram of MMSE system^[46]

Fig. 3. Schematic diagram of incident beam, target, and detector when collecting specular reflection signal with GOSI^[4]

Fig. 4. Schematic diagram of TMS system^[8]

Fig. 5. Schematic diagram of interferometric imaging phase measurement system^[9]

Fig. 6. Schematic diagram of the two-dimensional optical Fourier transform realized by an optical lens^[13]

Fig. 7. Schematic diagram of MSIS system ^[13]

Fig. 8. Schematic diagram of a system for measuring ADFs of scattered light using a digital camera^[50]

Fig. 9. Three-dimensional diffraction spectra of standard gratings in momentum space ^[13]

Fig. 10. Q factor analysis diagrams. (a) Experimentally measured extinction spectra (solid points) and the result of time-domain coupling mode theory fitting (black solid lines), wave vectors along the direction of Γ‑x;(b) corresponding radiative Q factor, non-radiative Q factor, and total Q factor in the direction of Γ‑x; (c) Q factor distribution in the first Brillouin region of momentum space ^[13]

Fig. 11. Experimental results. (a) Iso-frequency lines of the sample at different wavelengths (right), experimentally measured and symmetric Lorentz fitting of scattered light intensity with wavelength at different points (X, Y, and Z) in momentum space correspond to different Q factors (left); (b)(c) light intensity of bound state samples in the combined and isolated continuous spectra at point W varies with wavelength, corresponding to different Q factors, respectively^[57]

Fig. 12. Experimental measurements of the spatial polarization state of momentum. (a) The measured amplitudes of coupling coefficients for s, p and ±45° components;; (b) phase difference cosine distribution of s component and p component (top) and measured polarization state distribution (bottom) ^[13]

Fig. 13. Fitted results of the experimentally measured and calculated Mueller matrix of grating diffraction^[47]

Fig. 14. Reflection phase in momentum space^[13]

Fig. 15. Phase vortex distribution of photonic crystal thin plate^[66]

Fig. 16. Two algorithms for inverse scattering problem based on neural networks. (a) Solution process diagram of the two algorithms; (b) structure diagram of sample and angular resolution spectrogram of sample^[27]

Fig. 17. Modeling diagram of surface topography grating^[18]

Fig. 18. Geometrical model of diffraction grating and corresponding fitting parameter groups. (a) Rectangle (H，L); (b) symmetric trapezoid（H，L，A）; (c) top corner rounded rectangle (H，L, R); (d) symmetric trapezoid (H，L，A，R) with a chamfered top angle; (e) asymmetric trapezoid (H，L，A，B) ^[83]

Fig. 19. Cone diffraction diagram and measured results. (a) Schematic diagram of conical diffraction of one-dimensional grating; (b) variance of the theoretically calculated and experimentally measured Mueller matrix varies with A and L (H=20 nm) under different azimuths using the model II; (c) variance minimum obtained under different azimuths using the geometric model I-V^[83]

Fig. 20. Distribution of reflection, transmission coefficient and its absolute value, and phase change at the interface between air and glass with the angle. (a) Distribution of reflection and transmission coefficients; (b) distribution of absolute values of reflection and transmission coefficients; (c) distribution of phase changes at the interface between air and glass ^[58]

Fig. 21. Schematic diagram of the first generation of computed tomography scanners^[92]

Fig. 22. Propagation of focused beam in tissue^[93]

Fig. 23. Schematic diagram of angular memory effects of laser incident on (a) thick-less diaphragm and (b) random phase mask^[98]

Fig. 24. Schematic diagram of three-dimensional imaging of scattered medium. (a) Pulsed laser and time-resolved single photon detector scan the surface of the scattering medium; (b) light is diffused in the medium, reflected by the concealment, and diffused back through the medium to the detector; (c) photons returned from the cache are captured by the detector over time^[7]

Fig. 25. Image of defect measured results based on Angle resolution spectroscopy. (a) Comparison of measured results of scattering sensor and white light interferometry^[115]; (b) measured results of model-free scattering technique for defect detection^[116]; (c) characteristics of far-field diffraction pattern generated by one-dimensional line grating structure under the irradiation of Gaussian beam and orbital angular momentum beam, including amplitude defects only^[117]; (d) normal incidence measured Muller matrix image of isolated silicon wire with nominal width of 100 nm^[118]

Fig. 26. Process of restoring multiple low-resolution intensity images captured at variable angles to one high-resolution intensity image and one high-resolution phase image ^[142]