Opto-Electronic Engineering, Volume. 38, Issue 7, 81(2011)
Study of Spatial Frequency Domain Analysis Method Based on White Light Interferometry
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XIE Yuan-an, HAN Zhi-gang. Study of Spatial Frequency Domain Analysis Method Based on White Light Interferometry[J]. Opto-Electronic Engineering, 2011, 38(7): 81
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Received: Mar. 24, 2011
Accepted: --
Published Online: Aug. 10, 2011
The Author Email: Yuan-an XIE (xieyuanan@163.com)
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