Fig. 1. AO system integrated with pattern reversal VEP (PR-VEP) measurements. SLD, superluminescent diode; BS, beam splitter; M, mirror; L, lens; P, artificial entrance pupil; D, diaphragm.

Fig. 2. Wavefront aberrations sensing and aberrations manipulation. Rxy−, the pseudo inverse version of the reconstruction matrix; A′, selectively correcting the Nth orders of Zernike aberrations; Ad, the Zernike coefficient values of superposition aberrations; G′, the wavefront slope matrix corresponding to A′; Gd, the wavefront slope matrix corresponding to Ad.

Fig. 3. Schematic of the miniaturized AO system. L, lens; BS, beam splitter; TL, trial lens holder; Ls, LED source; Pxyz, three-dimensional traveling platform.

Fig. 4. (a), (b) Zernike coefficient values , and (c), (d) PSF of subject CKY without and with AO correction. (a), (c) without AO correction. (b), (d) with AO correction.

Fig. 5. PR-VEP waveform comparison of three subjects without and with AO correction. (a) and (b) are the right and left eye of DP, respectively. (c), (d) and (e), (f) correspond to ZZ and CKY, respectively.

Fig. 6. Average NPN magnitude and latency of all eyes from three subjects. The first column (a), (c), (e) are the amplitudes at 4, 8, 16 cpd, respectively. The second column (b), (d), (f) are the latencies at 4, 8, 16 cpd, respectively.