NUCLEAR TECHNIQUES, Volume. 45, Issue 11, 110404(2022)
Development of extendable on-line test system for total ionizing dose effect of microprocessor
Figures & Tables(10)
Fig. 4. Change of cumulative verification errors of memory with irradiation dose
Fig. 5. Corresponding relationship between verification mode and microprocessor layout
Table 1. Method for typical parametric or functional verification of microprocessor
View tableView in ArticleTable 1. Method for typical parametric or functional verification of microprocessor
参数/功能Parameter/function 校验方式Verification method 内核直接参与Core involvement 微处理器状态Operational status 预载程序是否正常运行Check the operational status of the pre-programmed code 是Yes 片内存储Embedded memory 在固定存储地址预先写入参考值，定时读出并校验数值一致性，统计错误数量Compare the read out data and the pre-written reference data in certain addresses of the embedded memory, and record the number of errors 是Yes ADC 采集电路循环输入周期性模拟信号，ADC处理后由数字通信输出对比Apply the data acquisition board to generate periodic analog signals as inputs of ADC. Acquire the ADC-converted digital signals and make comparisons 是Yes DMA ADC/DAC的周期性信号传输至RAM固定地址，再输出对比Transmit the periodic signals of ADC/DAC to certain RAM addresses via DMA function. Acquire the direct output values of ADC/DAC and make comparisons 是Yes DAC DAC按指令循环输出周期性模拟信号，采集电路采集对比Apply the data acquisition board to generate periodic digital signals as inputs of DAC. Acquire the DAC-converted analog signals and make comparisons 是Yes 通信Communication 采集电路发送随机值至被测样品，经通信接口将其返回至采集电路，校验数值一致性Apply the data acquisition board to generate random data as input for the tested sample. Receive such data and return it to the data acquisition board via communication ports. Make comparisons between transmitted data and returned data. 是Yes 时钟Clock 采集电路中的高速计数器测量时钟频率或定时器输出Measure the clock frequency or timer output via the high-speed counter embedded in the data acquisition board 否No 功耗电流Supply current 采集电路测量芯片Icc Measure the Icc of the tested sample via the data acquisition board 否No
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Faguo CHEN, Weiyue YU, Runcheng LIANG, Zhirui ZHENG, Rong GUO. Development of extendable on-line test system for total ionizing dose effect of microprocessor[J]. NUCLEAR TECHNIQUES, 2022, 45(11): 110404
Paper Information
Category: Research Articles
Received: Sep. 13, 2022
Accepted: --
Published Online: Nov. 25, 2022
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