[1] [1] NOVOSELOV K S, GEIM A K, MOROZOV S V, et al. Electric field effect in atomically thin carbon films ［J］. Science, 2004, 306(5696): 666-669.

[2] [2] XU M, LIANG T, SHI M, et al. Graphene-Like Two-Dimensional Materials ［J］. Chemical Reviews, 2013, 113(5): 3766-3798.

[3] [3] ZHANG H. Ultrathin Two-Dimensional Nanomaterials ［J］. ACS Nano, 2015, 9(10): 9451-9469.

[4] [4] WANG G, BAKER-MURRAY A A, BLAU W J. Saturable Absorption in 2D Nanomaterials and Related Photonic Devices ［J］. Laser & Photonics Reviews, 2019, 13(7): 1800282.

[5] [5] HEINE T. Transition Metal Chalcogenides: Ultrathin Inorganic Materials with Tunable Electronic Properties ［J］. Accounts Of Chemical Research, 2015, 48(1): 65-72.

[6] [6] DHAKAL K P, DUONG D L, LEE J, et al. Confocal absorption spectral imaging of MoS2: optical transitions depending on the atomic thickness of intrinsic and chemically doped MoS2 ［J］. Nanoscale, 2014, 6(21): 13028-13035.

[7] [7] LI X-L, HAN W-P, WU J-B, et al. Layer-Number Dependent Optical Properties of 2D Materials and Their Application for Thickness Determination ［J］. Advanced Functional Materials, 2017, 27(19): 1604468.

[8] [8] SUTTER P, SUTTER E. Thickness determination of few-layer hexagonal boron nitride films by scanning electron microscopy and Auger electron spectroscopy ［J］. Apl Materials, 2014, 2(9):

[9] [9] LEBEDEV O I, KISELEV N A, VASILIEV A G, et al. TEM investigation of GexSi1-x/Si(111) heterostructures grown by MBE ［M］//CULLIS A G, STATONBEVAN A E. Microscopy of Semiconducting Materials 1995. 1995: 297-300.

[10] [10] ZHANG X, QIAO X F, SHI W, et al. Phonon and Raman scattering of two-dimensional transition metal dichalcogenides from monolayer, multilayer to bulk material ［J］. Chem Soc Rev, 2015, 44(9): 2757-2785.

[11] [11] LI X L, HAN W P, WU J B, et al. Layer-Number Dependent Optical Properties of 2D Materials and Their Application for Thickness Determination ［J］. Advanced Functional Materials, 2017, 27(19): 1604468.

[12] [12] ZENG H, LIU G-B, DAI J, et al. Optical signature of symmetry variations and spin-valley coupling in atomically thin tungsten dichalcogenides ［J］. Sci Rep, 2013, 3(1608-.

[13] [13] MASUBUCHI S, WATANABE E, SEO Y, et al. Deep-learning-based image segmentation integrated with optical microscopy for automatically searching for two-dimensional materials ［J］. npj 2D Materials and Applications, 2020, 4(1):

[14] [14] NOLEN C M, DENINA G, TEWELDEBRHAN D, et al. High-Throughput Large-Area Automated Identification and Quality Control of Graphene and Few-Layer Graphene Films ［J］. ACS Nano, 2011, 5(2): 914-922.

[15] [15] LIN X, SI Z, FU W, et al. Intelligent identification of two-dimensional nanostructures by machine-learning optical microscopy ［J］. Nano Res, 2018, 11(12): 6316-6324.

[16] [16] MASUBUCHI S, MACHIDA T. Classifying optical microscope images of exfoliated graphene flakes by data-driven machine learning ［J］. Npj 2d Materials And Applications, 2019, 3(

[17] [17] LU G, FEI B. Medical hyperspectral imaging: a review ［J］. J Biomed Opt, 2014, 19(1): 10901.

[18] [18] PU H, LIN L, SUN D W. Principles of Hyperspectral Microscope Imaging Techniques and Their Applications in Food Quality and Safety Detection: A Review ［J］. Compr Rev Food Sci Food Saf, 2019, 18(4): 853-866.

[19] [19] NIU Y, GONZALEZ-ABAD S, FRISENDA R, et al. Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS(2), MoSe(2), WS(2) and WSe(2) ［J］. Nanomaterials (Basel), 2018, 8(9):

[20] [20] TAGHAVI N S, GANT P, HUANG P, et al. Thickness determination of MoS2, MoSe2, WS2 and WSe2 on transparent stamps used for deterministic transfer of 2D materials ［J］. Nano Res, 2019, 12(7): 1691-695.

[21] [21] CASTELLANOS-GOMEZ A, AGRAT N, RUBIO-BOLLINGER G. Optical identification of atomically thin dichalcogenide crystals ［J］. Applied Physics Letters, 2010, 96(21): 213116.

[22] [22] FRISENDA R, NIU Y, GANT P, et al. Micro-reflectance and transmittance spectroscopy: A versatile and powerful tool to characterize 2D materials ［J］. Journal of Physics D: Applied Physics, 2017, 50(7):

[23] [23] LU Y, LI X-L, ZHANG X, et al. Optical contrast determination of the thickness of SiO2 film on Si substrate partially covered by two-dimensional crystal flakes ［J］. Science Bulletin, 2015, 60(8): 806-811.

[24] [24] WANG Y Y, GAO R X, NI Z H, et al. Thickness identification of two-dimensional materials by optical imaging ［J］. Nanotechnology, 2012, 23(49): 495713.

[25] [25] LAI J-M, XIE Y-R, ZHANG J. Detection of electron-phonon coupling in two-dimensional materials by light scattering ［J］. Nano Res, 2020,

[26] [26] HU X M, QIU C C, LIU D M. Rapid thin-layer WS2 detection based on monochromatic illumination photographs ［J］. Nano Res, 2021, 14(3): 840-845.

[27] [27] HU X, LIU H, QIU C, et al. Inspection of Line Defects in Transition Metal Dichalcogenides Using a Microscopic Hyperspectral Imaging Technique ［J］. J Phys Chem Lett, 2022, 2226-2230.

[28] [28] STENZEL O. The Physics Of Thin Film Optical Spectra ［M］. 2 ed.: Springer, 2016.

[29] [29] HU C, WANG H, SHEN Y, et al. Imaging layer thickness of large-area graphene using reference-aided optical differential reflection technique ［J］. Opt Lett, 2020, 45(15): 4136-4139.

[30] [30] MCINTYRE J D E, ASPNES D E. Differential reflection spectroscopy of very thin surface films ［J］. Surface Science, 1971, 24(2): 417-434.