Effect of Spectral Width of Thickness-Monitoring System on Performance of Narrow-Band Filters

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Acta Optica Sinica, Volume. 24, Issue 2, 251(2004)

[in Chinese]^*, [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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References(1)

[7] [7] Macleod H A. The effect of errors in the optical monitoring of narrow-band all dielectric thin film optical filters. Optica Acta, 1974, 21(6):429～443

CLP Journals

[1] WANG Shi-feng, YUAN Yan, SU Li-juan, AN Da. Measurement of the Spectral Characteristic Parameters of Linear Variable Filters[J]. Acta Photonica Sinica, 2017, 46(11): 1112002

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Effect of Spectral Width of Thickness-Monitoring System on Performance of Narrow-Band Filters[J]. Acta Optica Sinica, 2004, 24(2): 251

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Paper Information

Category: Thin Films

Received: Nov. 11, 2002

Accepted: --

Published Online: Jun. 12, 2006

The Author Email: (gupeifu@zju.edu.cn)

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology