Chinese Journal of Lasers, Volume. 50, Issue 18, 1801001(2023)

Short-Wavelength SiC Ultraviolet Single Photon Detector Based on Hole-Dominated Avalanche Multiplication

Linlin Su and Chengdong Yang*
Author Affiliations
  • School of Electronic Information Engineering, Wuxi University, Wuxi 214105, Jiangsu, China
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    Figures & Tables(7)
    Structural diagram of cross section of SiC nip APD
    Current-voltage and gain curves of SiC nip APD
    Avalanche characteristics of SiC nip APD under 220-320 nm incident ultraviolet light . (a) Gain curves; (b) breakdown voltage
    Characterization of SiC APD detection capability. (a) Passive quenching circuit; (b) one typical avalanche voltage pulse signal
    Dark count rate versus single photon detection efficiency for SiC nip APD under 240 nm and 280 nm incident UV light
    Optical response curve of SiC nip APD
    Avalanche voltage pulse height distributions of SiC nip APD under 240 nm and 280 nm incident UV light
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    Linlin Su, Chengdong Yang. Short-Wavelength SiC Ultraviolet Single Photon Detector Based on Hole-Dominated Avalanche Multiplication[J]. Chinese Journal of Lasers, 2023, 50(18): 1801001

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    Paper Information

    Category: laser devices and laser physics

    Received: Sep. 30, 2022

    Accepted: Nov. 28, 2022

    Published Online: Aug. 29, 2023

    The Author Email: Yang Chengdong (860118@cwxu.edu.cn)

    DOI:10.3788/CJL221289

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