Spectroscopy and Spectral Analysis, Volume. 29, Issue 8, 2291(2009)
Development of X-Ray Excited Fluorescence Spectrometer
[1] [1] Auffray E, et al. CERN–PPE/96–064 26 March, CMS TN/96-107, 1996. 7.
[2] [2] Larcheri S, Armellini C, Rocca F. Superlattices and Microstructures, 2006, 39: 267.
[3] [3] Gomonnai A V, Solomon A M, et al. Journal of Optoelectronics and Advanced Materials, 2001, 3(2): 509.
[4] [4] van Loef E V D, Glodo J, Higgins W M, et al. IEEE Transactions on Nuclear Science, 2005, 52(5): 1819.
[5] [5] Wisniewski D, Wojtowicz A J, Drozdowski W, et al. Cryst. Res. Technol., 2003, 38(3): 5275.
[7] [7] Govinda K Rajan, Jestin A Lenus. Pramana-Journal of Physics, 2005, 65(2): 323.
[8] [8] http://physics.nist.gov/PhysRefData/Xray MassCoef/ElemTab/z82.html
[10] [10] Gein R, Murray R B. Physical Review, 1963, 131(2): 508.
[11] [11] Jiri A Mares, Alena Beitlerova et al. Radiation Measurements, 2004, 38(4-6): 353.
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NI Chen, GU Mu, WANG Di, CAO Dun-hua, LIU Xiao-lin, HUANG Shi-ming. Development of X-Ray Excited Fluorescence Spectrometer[J]. Spectroscopy and Spectral Analysis, 2009, 29(8): 2291
Received: May. 8, 2008
Accepted: --
Published Online: May. 26, 2010
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