Acta Optica Sinica, Volume. 28, Issue s2, 314(2008)

Measurement of Electron Density in Plasma at Atmospheric Pressure by Spectroscopy

Ran Junxia1、*, Zhang Shaopeng2, Li Xia1, Li Honglian3, and Dong Lifang1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    References(10)

    [1] [1] Ulrich Kogelschatz. Dielectric-barrier discharges: Their history, discharge physics, and industrial applications[J].Plasma Chemistry and Plasma Processing, 2003, 23(1):1~46

    [2] [2] Baldur Eliasson, Ulrich Kogelschatz. Modeling and applications of silent discharge plasma[J].IEEE Trans. on Plasma Sci., 1991, 19(2):309~323

    [3] [3] V. Milosavljevic, S. Djenie. The He I 706.52 nm line shape characteristics in the plasma diagnostics[J]. Eur. Phys. J. D., 2003, 23(10):385~390

    [4] [4] N Konjevic. On the use of non-hydrogenic spectral line profiles for plasma electron density diagnostics[J]. Plasma Sources Sci. Technol., 2001, 10(2):356~363

    [5] [5] C. Stehlé, D. Gilles, A.V. Demura. Asymmetry of Stark profile-The microfield point of view[J]. Eur. Phys. J. D. ,2000, 12:355~367

    [8] [8] C. Penache, M. Miclea, A. Bruning-Demian et al.. Characterization of a high-pressure microdischarge using diode laser atomic absorption spectroscopy[J]. Plasma Sources Sci. Technol., 2002, 11(4):476~483

    [9] [9] Lifang Dong, Junxia Ran, Zhiguo Mao. Direct measurement of electron density in microdischarge at atmospheric pressure by Stark broadening[J].Appl. Phys. Lett., 2005, 86:161501

    [10] [10] L.F.Dong, Z.Q.Yin, X.C.Li et al.. Spatio-temporal dynamics of discharge domains in a dielectric barrier discharge device[J]. Plasma Sources Sci. Technol., 2003, 12(3):380~388

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    Ran Junxia, Zhang Shaopeng, Li Xia, Li Honglian, Dong Lifang. Measurement of Electron Density in Plasma at Atmospheric Pressure by Spectroscopy[J]. Acta Optica Sinica, 2008, 28(s2): 314

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    Paper Information

    Category: OPTOELECTRONICS

    Received: --

    Accepted: --

    Published Online: Jan. 5, 2009

    The Author Email: Junxia Ran (rjxhbu@hbu.cn)

    DOI:

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