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Semiconductor Optoelectronics, Volume. 46, Issue 3, 409(2025)

UIS Characteristics of A 4H-SiC Superjunction UMOSFET

CAO Rong and FENG Quanyuan
Author Affiliations
  • Institute of Microelectronics, Southwest Jiaotong University, Chengdu 611756, CHN
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    CAO Rong, FENG Quanyuan. UIS Characteristics of A 4H-SiC Superjunction UMOSFET[J]. Semiconductor Optoelectronics, 2025, 46(3): 409

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    Received: Aug. 12, 2024

    Accepted: Sep. 18, 2025

    Published Online: Sep. 18, 2025

    The Author Email:

    DOI:10.16818/j.issn1001-5868.20240812003

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology