Journal of Optoelectronics · Laser, Volume. 35, Issue 7, 723(2024)

Lightweight strip surface defect detection method based on improved YOLOv5s

SU Yingying*, HE Yaping, DENG Yuanyuan, LIU Xinghua, YAN Lei, and SI Hongyun
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  • College of Electrical Engineering, Chongqing University of Science and Technology, Chongqing 401331, China
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    SU Yingying, HE Yaping, DENG Yuanyuan, LIU Xinghua, YAN Lei, SI Hongyun. Lightweight strip surface defect detection method based on improved YOLOv5s[J]. Journal of Optoelectronics · Laser, 2024, 35(7): 723

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    Paper Information

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    Received: Apr. 3, 2023

    Accepted: Dec. 13, 2024

    Published Online: Dec. 13, 2024

    The Author Email: SU Yingying (2008026@cqust.edu.cn)

    DOI:10.16136/j.joel.2024.07.0163

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