Acta Photonica Sinica, Volume. 52, Issue 12, 1212003(2023)
High Precision Deflectometric Measurement Based on Pinhole Camera with an External Stop
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Lu YE, Xiangchao ZHANG, Junhua WANG, Min XU, Liehua ZHENG. High Precision Deflectometric Measurement Based on Pinhole Camera with an External Stop[J]. Acta Photonica Sinica, 2023, 52(12): 1212003
Category: Instrumentation, Measurement and Metrology
Received: Jun. 14, 2023
Accepted: Aug. 1, 2023
Published Online: Feb. 19, 2024
The Author Email: Xiangchao ZHANG (zxchao@fudan.edu.cn)