Comment on "Focusing of high polarization order axially-symmetric polarized beams" [Chin. Opt. Lett. 7, 938 (2009)]

Lifeng Li

doi:10.3788/COL20100811.1110

Chinese Optics Letters, Volume. 8, Issue 11, 1110(2010)

Comment on "Focusing of high polarization order axially-symmetric polarized beams" [Chin. Opt. Lett. 7, 938 (2009)]

Lifeng Li

State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instruments, Tsinghua University, Beijing 100084, China

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References(5)

[1] [1] Z. Zhou, Q. Tan, and G. Jin, Chin. Opt. Lett. 7, 938(2009).

[2] [2] B. Richards and E. Wolf, Proc. R. Soc. Lond. A 253, 358 (1959).

[3] [3] K. S. Youngworth and T. G. Brown, Opt. Express 7, 77(2000).

[4] [4] S. Quabis, R. Dorn, M. Eberler, O. Gl¨ockl, and G. Leuchs, Appl. Phys. B 72, 109 (2001).

[5] [5] M. Rashid, O. M. Marag`o, and P. H. Jones, J. Opt. A: Pure Appl. Opt. 11, 065204 (2009).

CLP Journals

[1] Zhehai Zhou, Qiaofeng Tan, Guofan Jin, "Surface plasmon interference formed by tightly focused higher polarization order axially symmetric polarized beams," Chin. Opt. Lett. 8, 1178 (2010)

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Lifeng Li, "Comment on "Focusing of high polarization order axially-symmetric polarized beams" [Chin. Opt. Lett. 7, 938 (2009)]," Chin. Opt. Lett. 8, 1110 (2010)

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Paper Information

Received: Aug. 19, 2010

Accepted: --

Published Online: Dec. 3, 2010

The Author Email:

DOI:10.3788/COL20100811.1110

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology