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Photonic Sensors, Volume. 6, Issue 2, 158(2016)

Shift Endpoint Trace Selection Algorithm and Wavelet Analysis to Detect the Endpoint Using Optical Emission Spectroscopy

Sihem BEN ZAKOUR1、* and Hassen TALEB2
Author Affiliations
  • 1Higher Institute of Management Tunis, University of Tunis, Tunisia
  • 2Higher institute of Business and Accounting Bizerte, University of Carthage, Tunisia
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    Sihem BEN ZAKOUR, Hassen TALEB. Shift Endpoint Trace Selection Algorithm and Wavelet Analysis to Detect the Endpoint Using Optical Emission Spectroscopy[J]. Photonic Sensors, 2016, 6(2): 158

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    Paper Information

    Category: Regular

    Received: Sep. 10, 2015

    Accepted: Jan. 20, 2016

    Published Online: Oct. 20, 2016

    The Author Email: ZAKOUR Sihem BEN (Sihembenzakour@yahoo.com)

    DOI:10.1007/s13320-016-0280-5

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology