Method for Calibrating Optical Axis Based on Characteristics of Optical Nodes

Tianyuan Gao; Han Zhang; Zhiying Liu; Guiyuan Jia; Xu Han; Jiake Wang; Xiandong Cheng

doi:10.3788/LOP202158.1112002

Laser & Optoelectronics Progress, Volume. 58, Issue 11, 1112002(2021)

Method for Calibrating Optical Axis Based on Characteristics of Optical Nodes

Tianyuan Gao^1,2、*, Han Zhang^1,2, Zhiying Liu^1,2, Guiyuan Jia^1,2, Xu Han^1,2, Jiake Wang^1,2, and Xiandong Cheng³

Author Affiliations

¹College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun , Jilin 130022, China

²Key Laboratory of Optoelectronic Measurement and Control and Optical Information Transmission Technology Ministry of Education, Changchun , Jilin 130022, China

³Jilin Provincial Education Examination Institute, Changchun , Jilin 130033, China

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Figures & Tables(13)

Fig. 1. Schematic of equivalent nodes of optical system

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Fig. 2. Equivalent nodes and nodes of lens

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Fig. 3. Change of focal plane image point after lens rotates around image square node

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Fig. 4. Change of focal plane image point after lens rotates around non-image side node

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Fig. 5. Calibrating optical path of optical axis

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Fig. 6. Whole structure of optical axis calibration system

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Fig. 7. Simulation experiment system of optical axis calibration

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Fig. 8. Experimental system for measuring modulation transfer function at optical axis

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Fig. 9. Relationship between average value of MTF and rotation angle

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Fig. 10. Optical axis calibration error of optical path

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Table 1. Sagittal MTF values after rotation at different angles

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Table 1. Sagittal MTF values after rotation at different angles

Angle /(°)	1	2	3	4	5	6	7	8	9	10
-0.5	54.7	54.8	54.9	54.7	54.8	54.8	54.9	54.9	54.8	54.8
-0.4	54.9	55.0	55.0	54.9	55.0	55.0	55.0	55.0	55.1	55.0
-0.3	55.1	55.1	55.4	55.0	55.1	55.1	55.0	55.1	55.2	55.2
-0.2	55.2	55.3	55.2	55.2	55.3	55.3	55.2	55.3	55.3	55.3
-0.1	55.4	55.4	55.4	55.3	55.5	55.4	55.3	55.3	55.4	55.4
0	55.5	55.5	55.5	55.5	55.6	55.5	55.5	55.4	55.5	55.5
0.1	55.4	55.4	55.5	55.4	55.4	55.4	55.4	55.3	55.4	55.4
0.2	55.3	55.3	55.4	55.2	55.3	55.3	55.2	55.2	55.3	55.3
0.3	55.2	55.1	55.2	55.1	55.1	55.2	55.1	55.1	55.0	55.2
0.4	55.1	55.0	55.0	55.0	55.0	55.0	54.9	55.0	54.9	55.0
0.5	55.0	54.9	54.8	54.9	54.8	54.8	54.8	54.8	54.8	54.9

Table 2. Meridian MTF values after rotation at different angles

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Table 2. Meridian MTF values after rotation at different angles

Angle /(°)	1	2	3	4	5	6	7	8	9	10
-0.5	54.1	54.3	54.4	54.3	54.2	54.3	54.2	54.3	54.2	54.1
-0.4	54.3	54.5	54.6	54.4	54.4	54.4	54.3	54.4	54.4	54.3
-0.3	54.7	54.7	54.8	54.7	54.6	54.6	54.7	54.7	54.6	54.7
-0.2	54.8	54.9	54.9	54.8	54.9	54.9	54.8	54.9	54.8	54.9
-0.1	54.9	55.0	54.9	54.9	55.0	55.0	55.0	55.0	54.9	55.0
0	55.0	55.1	55.0	55.0	55.1	55.1	55.1	55.1	55.0	55.0
0.1	54.9	55.0	55.0	54.9	55.0	55.0	55.0	55.0	55.0	54.9
0.2	54.7	54.9	54.9	54.8	54.9	54.9	54.9	54.8	54.8	54.8
0.3	54.5	54.7	54.8	54.6	54.7	54.7	54.6	54.6	54.6	54.6
0.4	54.3	54.5	54.6	54.4	54.5	54.5	54.5	54.4	54.4	54.4
0.5	54.2	54.3	54.4	54.2	54.3	54.3	54.2	54.1	54.2	54.2

Table 3. Average values and uncertainty of sagittal and meridian MTF measured 10 times

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Table 3. Average values and uncertainty of sagittal and meridian MTF measured 10 times

Serial number	Angle /(°)	Average Sag_MTF /mm	Uncertainty of Sag_MTF	Average Tan_MTF/mm	Uncertainty of Tan_MTF
1	-0.5	54.81	±0.07	54.24	±0.09
2	-0.4	54.99	±0.05	54.40	±0.09
3	-0.3	55.10	±0.06	54.68	±0.06
4	-0.2	55.26	±0.05	54.85	±0.05
5	-0.1	55.38	±0.06	54.95	±0.05
6	0	55.50	±0.04	55.04	±0.05
7	0.1	55.40	±0.04	54.96	±0.05
8	0.2	55.28	±0.06	54.83	±0.06
9	0.3	55.13	±0.06	54.64	±0.08
10	0.4	54.99	±0.05	54.44	±0.08
11	0.5	54.86	±0.06	54.24	±0.08

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Tianyuan Gao, Han Zhang, Zhiying Liu, Guiyuan Jia, Xu Han, Jiake Wang, Xiandong Cheng. Method for Calibrating Optical Axis Based on Characteristics of Optical Nodes[J]. Laser & Optoelectronics Progress, 2021, 58(11): 1112002

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Sep. 18, 2020

Accepted: Nov. 12, 2020

Published Online: Jun. 7, 2021

The Author Email: Tianyuan Gao (gty@cust.edu.cn)

DOI:10.3788/LOP202158.1112002

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology