Acta Optica Sinica, Volume. 39, Issue 2, 0212009(2019)

An Improved Inversion Algorithm to Measure Particle Size Distribution

Chen Wang1、*, Biao Zhang1、*, Lixia Cao1, Hongxi Yao2, and Chuanlong Xu1、*
Author Affiliations
  • 1 School of Energy and Environment, Southeast University, Nanjing, Jiangsu 210096, China
  • 2 Jiangsu Xiaofeng Environmental Protection Technologies Co., Ltd., Nanjing, Jiangsu 211111, China
  • show less
    Figures & Tables(11)
    Structural diagram of NFS setup for measuring particle size
    Process of measurement of particle size by NFS. (a) NFS image; (b) difference image; (c) image of power spectrum; (d) scattered light intensity
    Inversion results of single peak particle size distribution with noise γ=3%
    Inversion results of single peak particle size distribution with width σ=5
    Inversion results of bimodal particle size distribution with noise γ=0.5%
    Inversion results of bimodal particle size distribution with particle size ratio β=1…1.2
    Experimental setup for particle size measurement by NFS
    Particle size probability distribution of standard particle with particle size of 40 μm
    Particle size probability distribution of bimodal latex spheres with TSVD algorithm
    Particle size probability distribution of mixed solution by proposed algorithm
    • Table 1. Inversion results of bimodal particle size distributions at different noise levels

      View table

      Table 1. Inversion results of bimodal particle size distributions at different noise levels

      γ /%00.050.100.50
      Chahineε /%57.2857.2652.3852.35
      R /%76.3776.3976.4081.49
      TSVDε /%6.5710.4416.9832.94
      R /%99.0196.5395.2492.77
      Proposedε /%4.447.969.6715.92
      R /%99.8899.5398.9698.60
    Tools

    Get Citation

    Copy Citation Text

    Chen Wang, Biao Zhang, Lixia Cao, Hongxi Yao, Chuanlong Xu. An Improved Inversion Algorithm to Measure Particle Size Distribution[J]. Acta Optica Sinica, 2019, 39(2): 0212009

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Aug. 27, 2018

    Accepted: Oct. 9, 2018

    Published Online: May. 10, 2019

    The Author Email:

    DOI:10.3788/AOS201939.0212009

    Topics